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Qualitative analysis of XPS
X-ray photoelectron spectroscopy (XPS) uses X-ray to irradiate the sample, which can excite the inner electrons or valence electrons of atoms or molecules. The electrons excited by photons are called photoelectrons, which can measure the energy of photoelectrons. The photoelectron spectroscopy can be made with the kinetic energy of photoelectrons as the abscissa and the relative intensity (pulse / s) as the ordinate, so as to obtain the composition of the object to be measured. XPS is mainly used to determine the binding energy of electrons to realize the qualitative analysis of surface elements, including valence states.

Main application

1. Qualitative analysis of elements. All elements except h and he can be identified according to the position of the characteristic lines in the energy spectrum.

Quantitative analysis of 2 elements. According to the photoelectron line intensity (the area of photoelectron peak) in the energy spectrum, the content or relative concentration of the reaction atom.

3 solid surface analysis. It includes the chemical composition or element composition of the surface, the valence state of the atom, the distribution of the surface energy state, the distribution of the electron cloud and the energy level structure of the surface electron.

4. The structure of the compound. It can accurately measure the chemical shift of the binding energy of the inner layer electron, and provide the information of chemical bond and charge distribution.

Japan axis ultra DLD X-ray photoelectron spectrometer

The instrument is mainly used for surface chemical composition, chemical element image, chemical valence state, valence band structure, crystal structure analysis and depth analysis of solid samples.

It can be used for the analysis of inclusions in metals and alloys, slag, ore phase, elements in materials and their depth distribution in bulk phase

The specific information of element change layer by layer (including valence state, content, distribution and element image).

It is suitable for conductors, semiconductors, insulators, powders and films of non radioactive and non-volatile metals and alloys.

quantitative analysis

According to the photoelectron line intensity (the area of photoelectron peak) in the energy spectrum, the content or relative concentration of the reaction atom.

Solid surface analysis
It includes the chemical composition or element composition of the surface, the valence state of the atom, the distribution of the surface energy state, the distribution of the electron cloud and the energy level structure of the surface electron.

XPS is mainly used to analyze the composition and chemical state of solid sample surface. Able to conduct qualitative, semi quantitative and valence analysis. Widely used in polymer, inorganic compounds, organic compounds, catalysts, coating materials, nano materials, ores and other materials.

For block and film samples, the diameter shall not exceed 8mm, and the thickness shall not exceed 3mm; for powder samples, the test can only be conducted after baking in the oven.