Instrument name: S4800 field emission scanning electron microscope

At an acceleration voltage of 15 kV, the secondary electron resolution is 1 nm; at an acceleration voltage of 1 kV (deceleration mode), the secondary electron resolution is 1.4 nm;    Microstructure of the material, micro-region composition analysis, low acceleration voltage can directly observe non-conductive samples .
Main functions and application scope:

Scanning electron microscope has the characteristics of high depth of field, high resolution, high magnification, easy operation and simple sample preparation. It can be used to directly observe the surface morphology of the sample. Widely used in materials science, biomedicine, physics, chemistry, geology, mechanical processing, microcircuit quality inspection, failure analysis and other fields.

Charge standard: 600-1200 yuan/sample