Two-dimensional material micro-nano processing - in situ testing Two-dimensional material micro-nano processing - in situ testing> GaN wafer

产品:10×10.5mm2 GaN self-supporting wafer (Fe doped)

Detailed

Performance parameters:

  • Product number GaN-FS-C-SI-S10
    Size 10×10.5mm2
    Thickness 350±25μm
    Crystal orientation C-plane(0001)off angle toward M-Axis 0.35°±0.15°
    TTV ≤10μm
    Curvature ≤10μm
    Conductivity type Semi-Insulating
    Resistivity (300 K) > 106Ω·cm
    Dislocation density From 1x105to 3x106cm-2
    Effective area >90%
    Polished Front Surface:Ra<0.2 nm(polished);
    or <0.3nm(polished and surface treatment for epitaxy)
    Back Surface:0.5~1.5μm;
    option:1-3nm(Fine ground);<0.2nm(polished)
    package Packaged in a class 100 clean room environment,
    in single container,under a nitrogen atmosphere.





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Item ID Info
BK2020081706-01 CAS:
ID:BK2020081706
Pack:Ga-抛光
Parameter:位错密度:1~3 x 106 cm-2
Stock:100
Make up:
Price:$390
BK2020081706-02 CAS:
ID:BK2020081706
Pack:Ga-抛光
Parameter:位错密度:5~9 x 105 cm-2
Stock:100
Make up:
Price:$490
BK2020081706-03 CAS:
ID:BK2020081706
Pack:Ga-抛光
Parameter:位错密度:1~5 x 105 cm-2
Stock:100
Make up:
Price:$790
BK2020081706-04 CAS:
ID:BK2020081706
Pack:N-抛光
Parameter:位错密度:1~3 x 106 cm-2
Stock:100
Make up:
Price:$390
BK2020081706-05 CAS:
ID:BK2020081706
Pack:N-抛光
Parameter:位错密度:5~9 x 105 cm-2
Stock:100
Make up:
Price:$490
BK2020081706-06 CAS:
ID:BK2020081706
Pack:N-抛光
Parameter:位错密度:1~5 x 105 cm-2
Stock:100
Make up:
Price:$790
BK2020081706-07 CAS:
ID:BK2020081706
Pack:Double-抛光
Parameter:位错密度:1~3 x 106 cm-2
Stock:100
Make up:
Price:$430
BK2020081706-08 CAS:
ID:BK2020081706
Pack:Double-抛光
Parameter:位错密度:5~9 x 105 cm-2
Stock:100
Make up:
Price:$530
BK2020081706-09 CAS:
ID:BK2020081706
Pack:Double-抛光
Parameter:位错密度:1~5 x 105 cm-2
Stock:100
Make up:
Price:$830
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