Two-dimensional material micro-nano processing - in situ testing Two-dimensional material micro-nano processing - in situ testing> Customized wafer consumables

产品:Te tellurium semi-metallic film

Detailed

The above price is a reference price, please consult the technology for detailed quotation.
Substrate: standard 4-inch pure silicon wafer,
Film thickness: 50nm,

Thin film deposition method: Electron beam evaporation coating


Warm tip: the products supplied by Beijing Beike Xincai Technology Co., Ltd. are only used for scientific research, not for human body


Item ID Info
BK2022051203-01 CAS：
ID：BK2022051203
Pack：4inch
Parameter：
Stock：100
Make up：
Price：$225
return
Copyright © beijing beike new material Technology Co., Ltd 京ICP备16054715-2号