|
BK2020011701
|
| |
微区力学性能分析 |
| BK2020011701-03 |
原位疲劳 |
| BK2020011701-02 |
压痕测试 |
| BK2020011701-01 |
AFM原子力显微镜 |
|
询价
|
|
BK2020011702
|
| |
电镜样品制备 |
| BK2020011702-03 |
聚焦离子束系统（FIB） |
| BK2020011702-02 |
喷碳 |
| BK2020011702-01 |
离子减薄 |
|
询价
|
|
BK2020011703
|
| |
X射线光电子能谱分析XPS |
| BK2020011703-03 |
固体表面分析 |
| BK2020011703-02 |
定量分析 |
| BK2020011703-01 |
XPS定性分析 |
|
询价
|
|
BK2020011704
|
| |
X射线衍射分析XRD |
| BK2020011704-07 |
X射线衍射 |
| BK2020011704-06 |
显微结晶学分析 |
| BK2020011704-05 |
取向分析 |
| BK2020011704-04 |
晶粒尺寸测定 |
| BK2020011704-03 |
应力测定 |
| BK2020011704-02 |
点阵常数测定 |
| BK2020011704-01 |
物相分析 |
|
询价
|
|
BK2020011705
|
| |
透射电子显微分析TEM |
| BK2020011705-05 |
|
| BK2020011705-04 |
能谱分析EDS |
| BK2020011705-03 |
明暗场像 |
| BK2020011705-02 |
选区电子衍射 |
| BK2020011705-01 |
高分辨电子显微观察 |
|
询价
|
|
BK2020011706
|
| |
扫描电子显微分析SEM |
| BK2020011706-04 |
EBSD |
| BK2020011706-03 |
断口形貌分析 |
| BK2020011706-02 |
微区元素分析 |
| BK2020011706-01 |
表面形貌观察 |
|
询价
|
|
