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Scanning electron microscope (SEM)





ID:BKDY000022
CAS:
price: $140
Item ID:BKDY000022-01
specification:
Detailed

Instrument name: S4800 field emission scanning electron microscope

At an acceleration voltage of 15 kV, the secondary electron resolution is 1 nm; at an acceleration voltage of 1 kV (deceleration mode), the secondary electron resolution is 1.4 nm;    Microstructure of the material, micro-region composition analysis, low acceleration voltage can directly observe non-conductive samples .
Main functions and application scope:

Scanning electron microscope has the characteristics of high depth of field, high resolution, high magnification, easy operation and simple sample preparation. It can be used to directly observe the surface morphology of the sample. Widely used in materials science, biomedicine, physics, chemistry, geology, mechanical processing, microcircuit quality inspection, failure analysis and other fields.

Charge standard: 600-1200 yuan/sample



Warm tip: the products supplied by Beijing Beike Xincai Technology Co., Ltd. are only used for scientific research, not for human body

Item ID CAS ID Pack Parameter Stock Make up Price
BKDY000022-01 BKDY000022 1个 100 $140
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